Wes Smith


Mr. Smith brings 20 years of engineering, sales, & managerial experience in the semiconductor industry to Semicon West & TestVision.   He is the author & presenter of 25 published papers in Semiconductor Metrology, Test, and Test Data Analysis.  As a Senior member of IEEE, he serves on the ITC-DATA Conference Committee, & the SEMI Collaborative Alliance for Semiconductor Test ATE Standards Committee.   Mr. Smith has BS degrees in Materials Science & Economics from Clemson University, and a Master of International Business from the University of South Carolina.

Share page with AddThis