TechTALK: Materials Session — Reducing Risk for Customers

TechTALKS Stage North Tuesday, July 09
2:00pm to 4:00pm

With the increasing complexity of IC architecture, and the continuing evolution towards the need to control each circuit component down to the molecular level, it is becoming essential to define new and/or updated ways to detect, measure and eliminate sources of contamination, ultimately reducing risks and costs for IDM’s. Key topics will include role of particles, impurities and associated analysis, as well as a panel session, allowing attendees to provide direct inquires on all topics.

Share page with AddThis