Design 2.1 - Design to Test: New Methodology Enables First-time Success in Test Program Bring-up, even Before Silicon Arrives!

Moscone North Room 21 Wednesday, July 10
2:15pm to 2:40pm

Test teams often face tight schedule yet lengthy and repetitive process in test program development before a device can be successfully exercised on an automatic test equipment (ATE) for characterization, production, and debug.  The pressure is now tremendously reduced when the test team can get a head start in ensuring their test program will work according to design’s test plan even before tapeout.  This paper presents a new methodology practiced at amsAG where test engineers there use the same ATE environment to interact with the device, while it’s still in its Verilog netlist form, in order to establish all necessary initialization and communication with the ATE test program.  When the silicon arrives, the test engineer is already knowledgable of the device functionality, test plan, and the test program is ready for physical characterizations.  A case study is also presented here with techniques and benefits seen.

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