Session 3.1 - Artificial Intelligence: Test Intelligence vs. Artificial Intelligence: The Challenges of AI Testing

Thursday, July 11
10:00am to 10:25am

The rise of AI has created created entire new ecosystems of companies designing and producing Server-Class Processors and ASICs.   This paper explores some of the new EDA tools and test strategies that have also arisen to help meet the challenge, including the use of AI itself. 

Share page with AddThis