Alexa Greer is a Technical Engagement Manager with over 15 years of experience in the semiconductor industry, concentrating on defect and yield management. Alexa has dedicated more than a decade of that time at KLA, driving wafer inspection application projects with leading edge chip manufacturers across North America. Throughout her career in applications engineering, Alexa has closely collaborated with customers to identify and solve process issues for improved device yield.
Engaged in all areas of unpatterned and patterned wafer inspection, Alexa is an expert on KLA’s Broadband Plasma Wafer Inspection Systems and applications related to design and process window systematic defect discovery. Alexa’s advanced knowledge and novel applications have been published multiple times for the SEMI ASMC conferences, earning her the Best Paper Award in 2008. Previously, Alexa worked at Eastman Kodak Company, where she championed in-depth characterization and defect reduction efforts on CCD image sensors. She holds a B.S. degree in Micro-Electronic Engineering from the Rochester Institute of Technology in NY.
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